X-Strata 920

Cost-effective, rapid and reliable XRF for coating thickness measurement and materials analysis with X-Strata 920. Powerful, reliable and easy to use EDXRF spectrometer guaranteeing quality and reducing costs. X-Strata920 is supplied with over 800 pre-loaded, easy-to-select application parameters/methods .

Coating thickness and materials analysis based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical technique, offering easy-to-use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analysing wide element range on the periodic table.