FT 160 Coating Thickness Measurement Instrument

Equipped with polycapillary X-ray focusing optics and a silicon drift detector, FT160 enables high preciseness and high throughput in nano-order level coating thickness measurement of electronic parts. Accomplishing highly precise measurement by irradiate high-luminance primary x-ray to the area of about 30 μmφ.  

Three chamber configurations for your parts: 

  • FT160 – Standard configuration with flexibility to measure components and boards. 
  • FT160S – Compact footprint for small parts, with the same performance as the larger configurations. 
  • FT160L – Larger sample table for PCBs up to 600 x 600 mm.
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